Research output per year
Research output per year
Personal profile
In Korean
우지용 교수(IT대학 전자공학부)
Education
(2010), B.S., Hanyang University
(2012) M.S., Gwangju Institutue of Science and Technology
(2017) Ph.D., Pohang University of Science and Technology
(2012) M.S., Gwangju Institutue of Science and Technology
(2017) Ph.D., Pohang University of Science and Technology
Professional Experience
(2017~2018), Postdoctoral Researcher, Arizona State University
(2019~2019), Postdoctoral Researcher, Georgia Institue of Technoglogy
(2019~2020), ETRI
(2020~Present) Associate Professor, Kyungpook National University
(2019~2019), Postdoctoral Researcher, Georgia Institue of Technoglogy
(2019~2020), ETRI
(2020~Present) Associate Professor, Kyungpook National University
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Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
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Comprehensive Reliability Assessment of WOx Engineering for Temperature-Resilient HfZrO2 FeCAP
Kim, E., Park, H., Jeong, J., Lim, S. & Woo, J., 2025, 2025 IEEE International Reliability Physics Symposium, IRPS 2025 - Proceedings. Institute of Electrical and Electronics Engineers Inc., (IEEE International Reliability Physics Symposium Proceedings).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
2 Scopus citations -
Effect of SiO2 interfacial layer on InGaZnO-based memristors for neuromorphic computing applications
Myoung, S. J., Shin, D. H., Kim, D., Kim, C., Bae, J. H., Choi, S. J., Kim, D. M., Woo, J. & Kim, D. H., Mar 2025, In: Ceramics International. 51, 6, p. 7651-7656 6 p.Research output: Contribution to journal › Article › peer-review
2 Scopus citations -
Exploiting galvanic effect in Ag-Al alloy ion reservoir of resistive switching device for high-density cross-point array memory system
Lim, S. & Woo, J., 1 May 2025, In: AIP Advances. 15, 5, 055014.Research output: Contribution to journal › Article › peer-review
Open Access -
Impact of Non-ideal Reliability Characteristics of SiOx p-Bit for Complex Optimization Problem Solver
Kim, J., Choi, H. & Woo, J., 2025, 2025 IEEE International Reliability Physics Symposium, IRPS 2025 - Proceedings. Institute of Electrical and Electronics Engineers Inc., (IEEE International Reliability Physics Symposium Proceedings).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
1 Scopus citations -
Interface effect based nano-scale TiOX vertical synapse device for high-density integration in neuromorphic computing system
Cho, S., Han, G., Lee, C., Woo, J. & Lee, D., 7 Apr 2025, In: Nanotechnology. 36, 14, 145201.Research output: Contribution to journal › Article › peer-review
1 Scopus citations