A 3.3-V 4-Mb nonvolatile ferroelectric RAM: Novel design techniques immune to instable cell capacitor

Yeonbae Chung, Byung Gil Jeon, Kang Deog Suh

Research output: Contribution to journalArticlepeer-review

Abstract

This work presents, for the first time, a 4 mega-bits FRAM with novel design techniques which are deviced to achieve a stable FRAM cell operation; 1) open bitline cell array, 2) selectively-driven double-pulsed plate read/write-back scheme, and 3) complementary data preset reference circuitry and relaxation/fatigue/imprint-free reference voltage generator. The prototype device incorporating these circuit schemes shows 75 ns access time, 21 mA active current at 3.3 V, 25 °C and 110 ns cycle. It measures 116 mm 2 using 0.6 μm CMOS technology.

Original languageEnglish
Pages (from-to)S884-S888
JournalJournal of the Korean Physical Society
Volume35
Issue numberSUPPL. 4
StatePublished - 1999

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