Abstract
Ultrathin doped layers, known as delta-doped layers, were introduced within the intrinsic amorphous silicon (a-Si) active layer to fabricate hydrogenated amorphous silicon (a-Si:H) thin-film transistors (TFTs) with enhanced field-effect mobility. The performance of the delta-doped a-Si:H TFTs depended on the phosphine (PH3) flow rate and the distance from the n+ a-Si to the deltadoping layer. The delta-doped a-Si:H TFTs fabricated using a commercial manufacturing process exhibited an enhanced field-effect mobility of approximately ~0. 23 cm2/Vs (compared to a conventional a-Si:H TFT with 0. 15 cm2/Vs) and a desirable stability under a bias-temperature stress test.
Original language | English |
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Pages (from-to) | 1835-1839 |
Number of pages | 5 |
Journal | Journal of the Korean Physical Society |
Volume | 61 |
Issue number | 11 |
DOIs | |
State | Published - 2012 |
Keywords
- a-Si:H TFT
- Delta doping
- Mobility