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A delta-doped amorphous silicon thin-film transistor with high mobility and stability

  • Pyunghun Kim
  • , Kyung Min Lee
  • , Eui Wan Lee
  • , Younjung Jo
  • , Do Hyung Kim
  • , Hong jae Kim
  • , Key Young Yang
  • , Hyunji Son
  • , Hyun Chul Choi
  • Kyungpook National University
  • LG Corporation

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

Ultrathin doped layers, known as delta-doped layers, were introduced within the intrinsic amorphous silicon (a-Si) active layer to fabricate hydrogenated amorphous silicon (a-Si:H) thin-film transistors (TFTs) with enhanced field-effect mobility. The performance of the delta-doped a-Si:H TFTs depended on the phosphine (PH3) flow rate and the distance from the n+ a-Si to the deltadoping layer. The delta-doped a-Si:H TFTs fabricated using a commercial manufacturing process exhibited an enhanced field-effect mobility of approximately ~0. 23 cm2/Vs (compared to a conventional a-Si:H TFT with 0. 15 cm2/Vs) and a desirable stability under a bias-temperature stress test.

Original languageEnglish
Pages (from-to)1835-1839
Number of pages5
JournalJournal of the Korean Physical Society
Volume61
Issue number11
DOIs
StatePublished - 2012

Keywords

  • a-Si:H TFT
  • Delta doping
  • Mobility

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