A Family of Single-Stage High-Gain Dual-Buck Split-Source Inverters

Fazal Akbar, Honnyong Cha, Hafiz Furqan Ahmed, Ashraf Ali Khan

Research output: Contribution to journalArticlepeer-review

38 Scopus citations

Abstract

In this paper, a family of single-phase single-stage high-gain dual-buck split-source inverters (SSIs) is proposed. The proposed inverters have the combine benefits of SSI, dual-buck inverter (DBI), and high-gain dc-dc converters. Similar to the DBI, they provide high reliability by eliminating shoot-Through issues, increase switching frequency and efficiency by using power MOSFETs without leading the body diodes to reverse recovery issues, and decrease pulsewidth modulation (PWM) dead-Time. In addition, voltage boost operation is achieved in a single stage without using any additional active switch, which is in favor of lower control complexity and lower cost. On the other hand similar to the SSI, buck-boost dc-Ac power conversion is realized in a single stage. However, compared to the SSI, the proposed inverters have no shoot-Through issues, MOSFETs can be used without reverse recovery issues, dead-Time can be minimized, switching frequencies can be increased, and external fast recovery diodes can be used to improve efficiency. In addition, four different high-gain dual-buck SSIs are presented. As an example, the proposed switched-coupled-inductor split-source DBI is analyzed and compared with the other proposed structures. To validate the theoretical analysis, a 300-W experimental prototype is designed and tested at 25-35-V input voltage, 155~V-{\text {peak}} output voltages and 50 kHz.

Original languageEnglish
Article number8624500
Pages (from-to)1701-1713
Number of pages13
JournalIEEE Journal of Emerging and Selected Topics in Power Electronics
Volume8
Issue number2
DOIs
StatePublished - Jun 2020

Keywords

  • DC-AC converter
  • dual-buck inverter (DBI)
  • MOSFET
  • reliability
  • shoot-Through problem
  • split-source inverter (SSI)

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