A Novel Framework of Failure Localization in Optical Transport Network

Yan Jiao; Pin Han Ho; Xiangzhu Lu; Janos Tapolcai; Limei Peng

doi:10.1109/MCOM.006.2300243

A Novel Framework of Failure Localization in Optical Transport Network

Yan Jiao, Pin Han Ho, Xiangzhu Lu, Janos Tapolcai, Limei Peng

Research output: Contribution to journal › Article › peer-review

Abstract

This article presents a novel and efficient failure localization framework in Optical Transport Network (OTN), called Instance Correlation based Failure Localization (IC-FL). Specifically, IC-FL aims to localize faulty network devices in the OTN optical layer via correlation among the state changes of network devices and alarms using a trained binary classifier. Extensive case studies on single-board failure and regional failure are carried out to show the advantages seized by the proposed IC-FL via a suite of evaluation metrics and analyze its performance under distinct environmental variations such as network topology and traffic distribution.

Original language	English
Pages (from-to)	142-147
Number of pages	6
Journal	IEEE Communications Magazine
Volume	61
Issue number	12
DOIs	https://doi.org/10.1109/MCOM.006.2300243
State	Published - 1 Dec 2023

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10.1109/MCOM.006.2300243

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@article{0e3f7afd3fbe46fb96d670d89560b13e,

title = "A Novel Framework of Failure Localization in Optical Transport Network",

abstract = "This article presents a novel and efficient failure localization framework in Optical Transport Network (OTN), called Instance Correlation based Failure Localization (IC-FL). Specifically, IC-FL aims to localize faulty network devices in the OTN optical layer via correlation among the state changes of network devices and alarms using a trained binary classifier. Extensive case studies on single-board failure and regional failure are carried out to show the advantages seized by the proposed IC-FL via a suite of evaluation metrics and analyze its performance under distinct environmental variations such as network topology and traffic distribution.",

author = "Yan Jiao and Ho, {Pin Han} and Xiangzhu Lu and Janos Tapolcai and Limei Peng",

note = "Publisher Copyright: {\textcopyright} 1979-2012 IEEE.",

year = "2023",

month = dec,

day = "1",

doi = "10.1109/MCOM.006.2300243",

language = "English",

volume = "61",

pages = "142--147",

journal = "IEEE Communications Magazine",

issn = "0163-6804",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "12",

}

TY - JOUR

T1 - A Novel Framework of Failure Localization in Optical Transport Network

AU - Jiao, Yan

AU - Ho, Pin Han

AU - Lu, Xiangzhu

AU - Tapolcai, Janos

AU - Peng, Limei

PY - 2023/12/1

Y1 - 2023/12/1

N2 - This article presents a novel and efficient failure localization framework in Optical Transport Network (OTN), called Instance Correlation based Failure Localization (IC-FL). Specifically, IC-FL aims to localize faulty network devices in the OTN optical layer via correlation among the state changes of network devices and alarms using a trained binary classifier. Extensive case studies on single-board failure and regional failure are carried out to show the advantages seized by the proposed IC-FL via a suite of evaluation metrics and analyze its performance under distinct environmental variations such as network topology and traffic distribution.

AB - This article presents a novel and efficient failure localization framework in Optical Transport Network (OTN), called Instance Correlation based Failure Localization (IC-FL). Specifically, IC-FL aims to localize faulty network devices in the OTN optical layer via correlation among the state changes of network devices and alarms using a trained binary classifier. Extensive case studies on single-board failure and regional failure are carried out to show the advantages seized by the proposed IC-FL via a suite of evaluation metrics and analyze its performance under distinct environmental variations such as network topology and traffic distribution.

UR - http://www.scopus.com/inward/record.url?scp=85174845531&partnerID=8YFLogxK

U2 - 10.1109/MCOM.006.2300243

DO - 10.1109/MCOM.006.2300243

M3 - Article

AN - SCOPUS:85174845531

SN - 0163-6804

VL - 61

SP - 142

EP - 147

JO - IEEE Communications Magazine

JF - IEEE Communications Magazine

IS - 12

ER -

A Novel Framework of Failure Localization in Optical Transport Network

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