Abstract
This article presents a novel and efficient failure localization framework in Optical Transport Network (OTN), called Instance Correlation based Failure Localization (IC-FL). Specifically, IC-FL aims to localize faulty network devices in the OTN optical layer via correlation among the state changes of network devices and alarms using a trained binary classifier. Extensive case studies on single-board failure and regional failure are carried out to show the advantages seized by the proposed IC-FL via a suite of evaluation metrics and analyze its performance under distinct environmental variations such as network topology and traffic distribution.
| Original language | English |
|---|---|
| Pages (from-to) | 142-147 |
| Number of pages | 6 |
| Journal | IEEE Communications Magazine |
| Volume | 61 |
| Issue number | 12 |
| DOIs | |
| State | Published - 1 Dec 2023 |