A Novel Framework of Failure Localization in Optical Transport Network

This article presents a novel and efficient failure localization framework in Optical Transport Network (OTN), called Instance Correlation based Failure Localization (IC-FL). Specifically, IC-FL aims to localize faulty network devices in the OTN optical layer via correlation among the state changes of network devices and alarms using a trained binary classifier. Extensive case studies on single-board failure and regional failure are carried out to show the advantages seized by the proposed IC-FL via a suite of evaluation metrics and analyze its performance under distinct environmental variations such as network topology and traffic distribution.