A novel reversal method to estimate horizontal straightness/yaw error of a linear axis

K. I. Lee, J. C. Lee, S. H. Yang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The pose of a linear axis on machine tool can be modeled using the six geometric errors. The laser interferometer is used to estimate the geometric errors but this system has the limitation for accurate measurement due to high standard uncertainty and absence of identical reference coordinate. To overcome this limitation, reversal method is used to estimate geometric error. But conventional reversal method is designed without analyzing the standard uncertainty of estimated geometric error and also this method does not analyze the effect of set-up errors, obviously. For this reason, a novel reversal method is proposed to estimate the horizontal straightness error, δyx and yaw error, εzx of a linear axis simultaneously using the two capacitive sensors and one measurement target. To accurately estimate the geometric errors, the effect of standard uncertainty of sensors is minimized by determination of reference coordinate position. The set-up error of sensors and measurement target are eliminated by mathematical modeling.

Original languageEnglish
Title of host publicationProceedings of the 11th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2011
EditorsP. Shore, Henny Spaan, Theresa Burke, H. Van Brussel
Publishereuspen
Pages299-302
Number of pages4
ISBN (Electronic)9780955308291
StatePublished - 2011
Event11th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2011 - Como, Italy
Duration: 23 May 201126 May 2011

Publication series

NameProceedings of the 11th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2011
Volume1

Conference

Conference11th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2011
Country/TerritoryItaly
CityComo
Period23/05/1126/05/11

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