TY - JOUR
T1 - A parallel mode confocal system using a micro-lens and pinhole array in a dual microscope configuration
AU - Bae, Sang Woo
AU - Kim, Min Young
AU - Ko, Kuk Won
AU - Koh, Kyung Chul
PY - 2013
Y1 - 2013
N2 - The three-dimensional measurement method of confocal systems is a spot scanning method which has a high resolution and good illumination efficiency. However, conventional confocal systems had a weak point in that it has to perform XY axis scanning to achieve FOV (Field of View) vision through spot scanning. There are some methods to improve this problem involving the use of a galvano mirror [1], pin-hole array, etc. Therefore, in this paper we propose a method to improve a parallel mode confocal system using a micro-lens and pin-hole array in a dual microscope configuration. We made an area scan possible by using a combination MLA (Micro Lens Array) and pin-hole array, and used an objective lens to improve the light transmittance and signalto-noise ratio. Additionally, we made it possible to change the objective lens so that it is possible to select a lens considering the reflection characteristic of the measuring object and proper magnification. We did an experiment using 5X, 2.3X objective lens, and did a calibration of height using a VLSI calibration target.
AB - The three-dimensional measurement method of confocal systems is a spot scanning method which has a high resolution and good illumination efficiency. However, conventional confocal systems had a weak point in that it has to perform XY axis scanning to achieve FOV (Field of View) vision through spot scanning. There are some methods to improve this problem involving the use of a galvano mirror [1], pin-hole array, etc. Therefore, in this paper we propose a method to improve a parallel mode confocal system using a micro-lens and pin-hole array in a dual microscope configuration. We made an area scan possible by using a combination MLA (Micro Lens Array) and pin-hole array, and used an objective lens to improve the light transmittance and signalto-noise ratio. Additionally, we made it possible to change the objective lens so that it is possible to select a lens considering the reflection characteristic of the measuring object and proper magnification. We did an experiment using 5X, 2.3X objective lens, and did a calibration of height using a VLSI calibration target.
KW - Massive parallel system
KW - Micro bump inspection
KW - Micro lens array
KW - Micro pinhole array
KW - Multi confocal system
UR - http://www.scopus.com/inward/record.url?scp=84887166178&partnerID=8YFLogxK
U2 - 10.5302/J.ICROS.2013.13.9032
DO - 10.5302/J.ICROS.2013.13.9032
M3 - Article
AN - SCOPUS:84887166178
SN - 1976-5622
VL - 19
SP - 979
EP - 983
JO - Journal of Institute of Control, Robotics and Systems
JF - Journal of Institute of Control, Robotics and Systems
IS - 11
ER -