A piezoelectric shear stress sensor

Taeyang Kim, Aditya Saini, Jinwook Kim, Ashok Gopalarathnam, Yong Zhu, Frank L. Palmieri, Christopher J. Wohl, Xiaoning Jiang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

6 Scopus citations

Abstract

In this paper, a piezoelectric sensor with a floating element was developed for shear stress measurement. The piezoelectric sensor was designed to detect the pure shear stress, suppressing effects of normal stress components, by applying opposite poling vectors to the piezoelectric elements. The sensor was first calibrated in the lab by applying shear forces where it demonstrated high sensitivity to shear stress (91.3 ± 2.1 pC/Pa) due to the high piezoelectric coefficients of 0.67Pb(Mg1â•3Nb2â•3)O3-0.33PbTiO3 (PMN-33%PT, d31=-1330 pC/N). The sensor also exhibited negligible sensitivity to normal stress (less than 1.2 pC/Pa) because of the electromechanical symmetry of the device. The usable frequency range of the sensor is up to 800 Hz.

Original languageEnglish
Title of host publicationSensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2016
EditorsJerome P. Lynch
PublisherSPIE
ISBN (Electronic)9781510600447
DOIs
StatePublished - 2016
EventSensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2016 - Las Vegas, United States
Duration: 21 Mar 201624 Mar 2016

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9803
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceSensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2016
Country/TerritoryUnited States
CityLas Vegas
Period21/03/1624/03/16

Keywords

  • Bimorph piezoelectric structures
  • Electromechanical symmetry
  • Floating element
  • PMN-33%PT crystal

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