A reliable extraction method for source and drain series resistances in silicon nanowire metal-oxide-semiconductor field-effect-transistors (MOSFETs) based on radio-frequency analysis

  • Jae Hwa Seo
  • , Young Jun Yoon
  • , Hwan Gi Lee
  • , Gwan Min Yoo
  • , Eou Sik Cho
  • , Seongjae Cho
  • , Jung Hee Lee
  • , In Man Kang

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Fingerprint

Dive into the research topics of 'A reliable extraction method for source and drain series resistances in silicon nanowire metal-oxide-semiconductor field-effect-transistors (MOSFETs) based on radio-frequency analysis'. Together they form a unique fingerprint.
Sort by

Engineering