A reliable extraction method for source and drain series resistances in silicon nanowire metal-oxide-semiconductor field-effect-transistors (MOSFETs) based on radio-frequency analysis

Jae Hwa Seo, Young Jun Yoon, Hwan Gi Lee, Gwan Min Yoo, Eou Sik Cho, Seongjae Cho, Jung Hee Lee, In Man Kang

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

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