TY - GEN
T1 - A three-dimensional measurement system based on moiré interferometry for visual inspection of hemi-sphere objects
AU - Kim, Min Young
PY - 2007
Y1 - 2007
N2 - This paper focus on the measurement of hemi-sphere objects with specularity and shadow. For accurate measurement of these objects, a specially designed visual sensor system is proposed, which is based on phase shifting moire interferometry. To remove specular noise and shadow area efficiently, a compact multiple-pattern projection is implemented in the sensor system. To see how this system works, a series of experiments is performed and the results are analyzed in detail.
AB - This paper focus on the measurement of hemi-sphere objects with specularity and shadow. For accurate measurement of these objects, a specially designed visual sensor system is proposed, which is based on phase shifting moire interferometry. To remove specular noise and shadow area efficiently, a compact multiple-pattern projection is implemented in the sensor system. To see how this system works, a series of experiments is performed and the results are analyzed in detail.
KW - Bump inspection
KW - Hemi-sphere
KW - Moire
KW - Semiconductor packaging inspection
KW - Solder ball inspection
UR - http://www.scopus.com/inward/record.url?scp=48349147564&partnerID=8YFLogxK
U2 - 10.1109/ICCAS.2007.4406837
DO - 10.1109/ICCAS.2007.4406837
M3 - Conference contribution
AN - SCOPUS:48349147564
SN - 8995003871
SN - 9788995003879
T3 - ICCAS 2007 - International Conference on Control, Automation and Systems
SP - 2759
EP - 2762
BT - ICCAS 2007 - International Conference on Control, Automation and Systems
T2 - International Conference on Control, Automation and Systems, ICCAS 2007
Y2 - 17 October 2007 through 20 October 2007
ER -