A three-dimensional vision system using dual projection for shadow problem

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Currently, backlighting units have been studied widely for the uniform light source of flat panel in LCD display industry. Due to size, uniformity and efficiency of illumination source, traditional backlighting units composed of fluorescent lamps have been replaced with LED backlighting units gradually. In small display markets of cell-phone, PMP, PDA, etc., small-size LEDs are generally used for backlight units' illumination part. For their uniform light-emitting, the volumetric size control of each one's pocket is crucial in LED manufacturing process, because the pocket fills with the transparent molding material for protecting led die and bonding wire in final manufacturing stage. Here, we present a three-dimensional vision system for volumetric inspection of LED pocket. Because of the high ratio of outside wall's height to inside base's width, conventional measurement techniques easily produce noisy results due to the shadow problem. For preventing this effect, the proposed sensor system utilizes dual projection system. By using two measurement results acquired from projection with different incident angles, the shadow-free results can be acquired finally. In this paper, we will describe the sensor system's principle and the sensor fusion algorithm combining two measurement results. After a series of experiments, the measurements results are discussed in depth.

Original languageEnglish
Title of host publicationOptomechatronic Sensors and Instrumentation III
DOIs
StatePublished - 2007
EventOptomechatronic Sensors and Instrumentation III - Lausanne, Switzerland
Duration: 8 Oct 200710 Oct 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6716
ISSN (Print)0277-786X

Conference

ConferenceOptomechatronic Sensors and Instrumentation III
Country/TerritorySwitzerland
CityLausanne
Period8/10/0710/10/07

Keywords

  • Dual projection
  • LED inspection
  • Phase measuring profilometry
  • Shadow problem
  • Three-dimensional measurement
  • Volume inspection

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