A unified method to extract the effective mobility in InGaAs metal-insulator-semiconductor field-effect-transistors using scattering-parameters
- Tae Beom Rho
- , Hyeon Bhin Jo
- , Tae Woo Kim
- , Dae Hyun Kim
- Kyungpook National University
- University of Ulsan
Research output: Contribution to journal › Article › peer-review
1
Scopus
citations