AlGaN/SiC heterojunction ultraviolet photodiodes

A. V. Sampath, Y. Chen, Q. Zhou, R. W. Enck, G. A. Garrett, B. L. Vanmil, R. B. Chung, M. L. Reed, H. Shen, J. C. Campbell, M. Wraback

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

We report on improvement in the deep ultraviolet (DUV) photoresponse of SiC based detectors through the development of n-AlxGa1-xN/i-p SiC heterojunction photodiodes. Fabricated photodiodes have high external quantum efficiency (EQE), greater than 60%, over a wide spectral range from 215-255 nm that is ~10x enhancement in performance over comparable homogenous SiC photodiodes at the shortest wavelength. This is attributed to photogeneration of carriers within the SiC depletion region by DUV illumination of the diode through the n-AlxGa1-xN “window”, as compared to a typical homogenous SiC n-i-p structure where the carriers are photogenerated in the n-type neutral region, resulting in more efficient collection of holes through drift.

Original languageEnglish
Title of host publicationSilicon Carbide and Related Materials 2015
EditorsFabrizio Roccaforte, Filippo Giannazzo, Francesco La Via, Roberta Nipoti, Danilo Crippa, Mario Saggio
PublisherTrans Tech Publications Ltd.
Pages1206-1209
Number of pages4
ISBN (Print)9783035710427
DOIs
StatePublished - 2016
Event16th International Conference on Silicon Carbide and Related Materials, ICSCRM 2015 - Sicily, Italy
Duration: 4 Oct 20159 Oct 2015

Publication series

NameMaterials Science Forum
Volume858
ISSN (Print)0255-5476
ISSN (Electronic)1662-9752

Conference

Conference16th International Conference on Silicon Carbide and Related Materials, ICSCRM 2015
Country/TerritoryItaly
CitySicily
Period4/10/159/10/15

Keywords

  • AlGaN
  • Molecular beam epitaxy
  • SiC
  • Ultraviolet avalanche photodiodes

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