An online test and debug methodology for automotive image processing system

Hyunggoy Oh, Inhyuk Choi, Taewoo Han, Won Jung, Byungin Moon, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

In the digital system where safety is a major issue, the reliability issue has been more important. However, as the circuit design has been more complicated, the number of some errors which escaped from the pre-silicon verification has been increased and the undetected errors have a bad influence upon reliability. To solve this problem, an online test and debug methodology for the automotive image processing system is proposed in this paper. Experimental results show the proposed methodology has high system reliability and provides the concurrent operation with a negligible test time and a small hardware overhead compared to the previous works.

Original languageEnglish
Title of host publicationISOCC 2014 - International SoC Design Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages226-227
Number of pages2
ISBN (Electronic)9781479951260
DOIs
StatePublished - 16 Apr 2015
Event11th International SoC Design Conference, ISOCC 2014 - Jeju, Korea, Republic of
Duration: 3 Nov 20146 Nov 2014

Publication series

NameISOCC 2014 - International SoC Design Conference

Conference

Conference11th International SoC Design Conference, ISOCC 2014
Country/TerritoryKorea, Republic of
CityJeju
Period3/11/146/11/14

Keywords

  • automotive image processing system
  • online debug
  • online test

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