Analyses on small-signal parameters and radio-frequency modeling of gate-all-around tunneling field-effect transistors

Seongjae Cho, Jae Sung Lee, Kyung Rok Kim, Byung Gook Park, James S. Harris, In Man Kang

Research output: Contribution to journalArticlepeer-review

91 Scopus citations

Abstract

The small-signal parameters of gate-all-around tunneling field-effect transistors (GAA TFETs) with different gate lengths were extracted and analyzed in terms of their gate capacitance, source-drain conductance, transconductance, distributed channel resistance, and inversion layer length. Because of the unique current drive and inversion layer formation mechanisms of a TFET compared to a conventional MOSFET, the gate-bias dependence values of the primary small-signal parameters of a GAA TFET also differ. Based on understanding these parameters, the high-frequency performances of GAA TFETs were investigated using a technology computer-aided design simulation. A nonquasi-static radio-frequency model was used to extract the small-signal parameters, which were verified up to 100 GHz. The modeling results showed excellent agreement with the Y -parameters up to the cutoff frequency fT.

Original languageEnglish
Article number6043869
Pages (from-to)4164-4171
Number of pages8
JournalIEEE Transactions on Electron Devices
Volume58
Issue number12
DOIs
StatePublished - Dec 2011

Keywords

  • Gate-all-around (GAA)
  • modeling
  • nonquasi-static (NQS)
  • radio-frequency (RF)
  • small-signal parameters
  • technology computer-aided design (TCAD)
  • tunneling field-effect transistor (TFET)

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