Analysis and modeling of resistive probes

Sang Wan Kim; Woo Young Choi; Jae Young Song; Jong Pil Kim; Junsoo Kim; Hyoungsoo Ko; Hongsik Park; Chulmin Park; Seungbum Hong; Sung Hoon Choa; Jong Duk Lee; Hyungcheol Shin; Byung Gook Park

doi:10.1109/NMDC.2006.4388746

Analysis and modeling of resistive probes

Sang Wan Kim, Woo Young Choi, Jae Young Song, Jong Pil Kim, Junsoo Kim, Hyoungsoo Ko, Hongsik Park, Chulmin Park, Seungbum Hong, Sung Hoon Choa, Jong Duk Lee, Hyungcheol Shin, Byung Gook Park

School of Electronics Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

A simple model of the resistive probe was proposed for the first time to enhance its sensitivity. The model classifies output current into three components: sensing current, unmodulated current, and punch-through current. Based on it, the electrical performance of the resistive probe was analyzed. The proposed model is expected to contribute to improvement of the sensing performance of the resistive probe.

Original language	English
Title of host publication	2006 IEEE Nanotechnology Materials and Devices Conference, NMDC
Pages	318-319
Number of pages	2
DOIs	https://doi.org/10.1109/NMDC.2006.4388746
State	Published - 2006
Event	2006 IEEE Nanotechnology Materials and Devices Conference, NMDC - Gyeongju, Korea, Republic of Duration: 22 Oct 2006 → 25 Oct 2006

Publication series

Name	2006 IEEE Nanotechnology Materials and Devices Conference, NMDC
Volume	1

Conference

Conference	2006 IEEE Nanotechnology Materials and Devices Conference, NMDC
Country/Territory	Korea, Republic of
City	Gyeongju
Period	22/10/06 → 25/10/06

Keywords

Analysis
Modeling
Resistive probe
Sensitivity

Access to Document

10.1109/NMDC.2006.4388746

Cite this

Kim, S. W., Choi, W. Y., Song, J. Y., Kim, J. P., Kim, J., Ko, H., Park, H., Park, C., Hong, S., Choa, S. H., Lee, J. D., Shin, H., & Park, B. G. (2006). Analysis and modeling of resistive probes. In 2006 IEEE Nanotechnology Materials and Devices Conference, NMDC (pp. 318-319). Article 4388746 (2006 IEEE Nanotechnology Materials and Devices Conference, NMDC; Vol. 1). https://doi.org/10.1109/NMDC.2006.4388746

@inproceedings{0aadb82611a243ae97bcd4b2e804caad,

title = "Analysis and modeling of resistive probes",

abstract = "A simple model of the resistive probe was proposed for the first time to enhance its sensitivity. The model classifies output current into three components: sensing current, unmodulated current, and punch-through current. Based on it, the electrical performance of the resistive probe was analyzed. The proposed model is expected to contribute to improvement of the sensing performance of the resistive probe.",

keywords = "Analysis, Modeling, Resistive probe, Sensitivity",

author = "Kim, {Sang Wan} and Choi, {Woo Young} and Song, {Jae Young} and Kim, {Jong Pil} and Junsoo Kim and Hyoungsoo Ko and Hongsik Park and Chulmin Park and Seungbum Hong and Choa, {Sung Hoon} and Lee, {Jong Duk} and Hyungcheol Shin and Park, {Byung Gook}",

year = "2006",

doi = "10.1109/NMDC.2006.4388746",

language = "English",

isbn = "1424405408",

series = "2006 IEEE Nanotechnology Materials and Devices Conference, NMDC",

pages = "318--319",

booktitle = "2006 IEEE Nanotechnology Materials and Devices Conference, NMDC",

note = "2006 IEEE Nanotechnology Materials and Devices Conference, NMDC ; Conference date: 22-10-2006 Through 25-10-2006",

}

Kim, SW, Choi, WY, Song, JY, Kim, JP, Kim, J, Ko, H, Park, H, Park, C, Hong, S, Choa, SH, Lee, JD, Shin, H & Park, BG 2006, Analysis and modeling of resistive probes. in 2006 IEEE Nanotechnology Materials and Devices Conference, NMDC., 4388746, 2006 IEEE Nanotechnology Materials and Devices Conference, NMDC, vol. 1, pp. 318-319, 2006 IEEE Nanotechnology Materials and Devices Conference, NMDC, Gyeongju, Korea, Republic of, 22/10/06. https://doi.org/10.1109/NMDC.2006.4388746

TY - GEN

T1 - Analysis and modeling of resistive probes

AU - Kim, Sang Wan

AU - Choi, Woo Young

AU - Song, Jae Young

AU - Kim, Jong Pil

AU - Kim, Junsoo

AU - Ko, Hyoungsoo

AU - Park, Hongsik

AU - Park, Chulmin

AU - Hong, Seungbum

AU - Choa, Sung Hoon

AU - Lee, Jong Duk

AU - Shin, Hyungcheol

AU - Park, Byung Gook

PY - 2006

Y1 - 2006

N2 - A simple model of the resistive probe was proposed for the first time to enhance its sensitivity. The model classifies output current into three components: sensing current, unmodulated current, and punch-through current. Based on it, the electrical performance of the resistive probe was analyzed. The proposed model is expected to contribute to improvement of the sensing performance of the resistive probe.

AB - A simple model of the resistive probe was proposed for the first time to enhance its sensitivity. The model classifies output current into three components: sensing current, unmodulated current, and punch-through current. Based on it, the electrical performance of the resistive probe was analyzed. The proposed model is expected to contribute to improvement of the sensing performance of the resistive probe.

KW - Analysis

KW - Modeling

KW - Resistive probe

KW - Sensitivity

UR - http://www.scopus.com/inward/record.url?scp=50249131888&partnerID=8YFLogxK

U2 - 10.1109/NMDC.2006.4388746

DO - 10.1109/NMDC.2006.4388746

M3 - Conference contribution

AN - SCOPUS:50249131888

SN - 1424405408

SN - 9781424405404

T3 - 2006 IEEE Nanotechnology Materials and Devices Conference, NMDC

SP - 318

EP - 319

BT - 2006 IEEE Nanotechnology Materials and Devices Conference, NMDC

T2 - 2006 IEEE Nanotechnology Materials and Devices Conference, NMDC

Y2 - 22 October 2006 through 25 October 2006

ER -

Analysis and modeling of resistive probes

Abstract

Publication series

Conference

Keywords

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