Analysis of address discharge delay characteristics using transient characteristics of IR emission intensity in plasma display panel

Hyung Dal Park, Jae Hyun Kim, Heung Sik Tae, Deok Myeong Kim, Jeong Hyun Seo

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper analyzes the address discharge delay characteristics based on the measurement of the transient IR emission intensity according to the wall charge state after the reset discharge. This measurement result shows that the maximal erasure of the wall charges accumulating on the scan and address electrodes during the negative ramp-falling period induces the easy transition from the weak discharge to the strong discharge, thereby resulting in shortening the statistical delay time.

Original languageEnglish
Title of host publication49th Annual SID Symposium, Seminar, and Exhibition 2011, Display Week 2011
Pages1468-1470
Number of pages3
StatePublished - 2011
Event49th Annual SID Symposium, Seminar, and Exhibition 2011, Display Week 2011 - Los Angeles, CA, United States
Duration: 15 May 201120 May 2011

Publication series

Name49th Annual SID Symposium, Seminar, and Exhibition 2011, Display Week 2011
Volume3

Conference

Conference49th Annual SID Symposium, Seminar, and Exhibition 2011, Display Week 2011
Country/TerritoryUnited States
CityLos Angeles, CA
Period15/05/1120/05/11

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