Analysis of wall-voltage variation during address period using V(t) closed curves

Byung Tae Choi, Hyung Dal Park, Jae Kwang Lim, Heung Sik Tae, Min Hur, Soo Ho Park, Minsun Yoo, Kwang Sik Lee

Research output: Contribution to journalConference articlepeer-review

7 Scopus citations

Abstract

To explain a non-uniformity of the address discharge during an address period, the wall voltage variation during an address period was investigated as a function of the number of the applied address pulse by the Vt closed curve. It was observed that the wall voltage between the scan and address electrodes was decreased with an increase in the number of the applied address pulse. It was also observed that the wall voltage variation during an address period strongly depends on the voltage difference between the Y and A electrodes.

Original languageEnglish
Pages (from-to)565-568
Number of pages4
JournalDigest of Technical Papers - SID International Symposium
Volume38
Issue number1
DOIs
StatePublished - 2007
Event2007 SID International Symposium - Long Beach, CA, United States
Duration: 23 May 200725 May 2007

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