Analysis of weak and strong discharge characteristics for fast address discharge in microplasma cells

Hyung Dal Park, Jae Hyun Kim, Heung Sik Tae, Bo Sung Kim

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

In this paper, the voltage level of the negative falling ramp in the reset waveform is lower, the accumulated wall charges during the ramp-up period are more erased between A-Y electrodes, thus, reducing the number of wall charges prior to address discharge. In particular, the measured Vt closed-curves and the weak and strong discharge characteristics corresponding IR emission profiles show that fewer wall charges prior to an address discharge induce a decrease in the statistical time lag during the address period. The discharge transient contours of simultaneous discharges are changed by the wall voltage states after reset discharge, thereby influencing the statistical discharge time lag of the address discharge for the stable drive, thereby resulting in stable and fast addressing.

Original languageEnglish
Pages (from-to)25-33
Number of pages9
JournalMolecular Crystals and Liquid Crystals
Volume585
Issue number1
DOIs
StatePublished - 1 Jan 2013

Keywords

  • Fast address discharge
  • microplasma cells
  • Vclosed-curve
  • weak and strong discharge

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