Analysis on reset discharge characteristic in AC-PDP with sustain gap of 200 μm

Ki Hyung Park, Soo Kwan Jang, Heung Sik Tae, Jeong Hyun Seo, Seok Hyun Lee

Research output: Contribution to conferencePaperpeer-review

4 Scopus citations

Abstract

The reset discharge characteristic is investigated in a sustain gap of 200 μm. As the sustain gap is wider, the stable weak discharge region using an MgO cathode condition is decreased, whereas the unstable weak discharge region using a phosphor cathode condition is increased. To reduce the unstable reset discharge in a sustain gap of 200 μm, the bias voltage (Vadd-bias) needs to be applied additionally to the address electrode during the ramp-up period and the X-bias voltage (Vcom-bias) needs to be controlled properly to the common (X) electrode during the ramp-down period. The reset discharge in a sustain gap of 200 μm are examined in detail relative to the two parameters such as Vadd-bias and Vcom.bias.

Original languageEnglish
Pages1445-1448
Number of pages4
StatePublished - 2005
EventIDW/AD'05 - 12th International Display Workshops in Conjunction with Asia Display 2005 - Takamatsu, Japan
Duration: 6 Dec 20059 Dec 2005

Conference

ConferenceIDW/AD'05 - 12th International Display Workshops in Conjunction with Asia Display 2005
Country/TerritoryJapan
CityTakamatsu
Period6/12/059/12/05

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