Abstract
The reset discharge characteristic is investigated in a sustain gap of 200 μm. As the sustain gap is wider, the stable weak discharge region using an MgO cathode condition is decreased, whereas the unstable weak discharge region using a phosphor cathode condition is increased. To reduce the unstable reset discharge in a sustain gap of 200 μm, the bias voltage (Vadd-bias) needs to be applied additionally to the address electrode during the ramp-up period and the X-bias voltage (Vcom-bias) needs to be controlled properly to the common (X) electrode during the ramp-down period. The reset discharge in a sustain gap of 200 μm are examined in detail relative to the two parameters such as Vadd-bias and Vcom.bias.
Original language | English |
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Pages | 1445-1448 |
Number of pages | 4 |
State | Published - 2005 |
Event | IDW/AD'05 - 12th International Display Workshops in Conjunction with Asia Display 2005 - Takamatsu, Japan Duration: 6 Dec 2005 → 9 Dec 2005 |
Conference
Conference | IDW/AD'05 - 12th International Display Workshops in Conjunction with Asia Display 2005 |
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Country/Territory | Japan |
City | Takamatsu |
Period | 6/12/05 → 9/12/05 |