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Analyzation of Positive Feedback device with Steep Subthreshold Swing Characteristics in 14 nm FinFET Technology
Sung Yun Woo, Won Mook Kang, Kyu Bong Choi, Jangsaeng Kim, Chul Heung Kim, Jong Ho Bae, Byung Gook Park, Jong Ho Lee
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
1
Scopus
citations