Analyzation of Positive Feedback device with Steep Subthreshold Swing Characteristics in 14 nm FinFET Technology
- Sung Yun Woo
- , Won Mook Kang
- , Kyu Bong Choi
- , Jangsaeng Kim
- , Chul Heung Kim
- , Jong Ho Bae
- , Byung Gook Park
- , Jong Ho Lee
- Seoul National University
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
2
Scopus
citations