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Annealing temperature dependence of contact resistance and stability for Ti/Al/Pt/Au ohmic contacts to bulk n-ZnO
K. Ip, K. H. Baik, Y. W. Heo, D. P. Norton, S. J. Pearton, J. R. LaRoche, B. Luo, F. Ren, J. M. Zavada
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review