Annealing temperature dependence of contact resistance and stability for Ti/Al/Pt/Au ohmic contacts to bulk n-ZnO
- K. Ip
- , K. H. Baik
- , Y. W. Heo
- , D. P. Norton
- , S. J. Pearton
- , J. R. LaRoche
- , B. Luo
- , F. Ren
- , J. M. Zavada
- University of Florida
- United States Army Research Office
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review