Annealing temperature effect on the temperature coefficient of resistance for vanadium oxide (VOx) thin films as bolometer materials
- Junyeop Lee
- , Yeongsam Kim
- , Dong Geon Jung
- , Seongpil Hwang
- , Seong Ho Kong
- , Daewoong Jung
- Korea Institute of Industrial Technology
- Kyungpook National University
Research output: Contribution to journal › Article › peer-review
3
Scopus
citations