Annealing temperature effect on the temperature coefficient of resistance for vanadium oxide (VOx) thin films as bolometer materials

  • Junyeop Lee
  • , Yeongsam Kim
  • , Dong Geon Jung
  • , Seongpil Hwang
  • , Seong Ho Kong
  • , Daewoong Jung

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

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