Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA

  • Gabin An
  • , Juyeon Yoon
  • , Jeongju Sohn
  • , Jingun Hong
  • , Dongwon Hwang
  • , Shin Yoo

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

5 Scopus citations

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Computer Science