Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA
- Gabin An
- , Juyeon Yoon
- , Jeongju Sohn
- , Jingun Hong
- , Dongwon Hwang
- , Shin Yoo
- Korea Advanced Institute of Science and Technology
- SAP Labs Korea
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
5
Scopus
citations