@inproceedings{a58ab03480984c5a8e4a63d50ddd0627,
title = "B-H Curve Tracing by Magnetic Contact Force",
abstract = "This paper proposes a B-H curve tracing method for material by magnetic contact force. In general, material data used in electrical devices are measured by the Epstein frame and VSM. However, the Epstein frame is difficult to measure in the high magnetic field area, and the VSM is expensive. The proposed method in this paper tracks the magnetic flux density and magnetic field strength inside the sample by measuring the force of the magnetic contact force sensor. Low-cost miniaturization is possible in a new way that is different from the existing method. The proposed method is explained in principle through a simple model and demonstrated through simulation.",
keywords = "B-H Curve, electrical machine, magnetic contact force, method",
author = "Yun, {Chang Ik} and Kim, {Gui Hwan} and Seok, {Chang Hoon} and Choi, {Hong Soon} and Jangho Seo",
note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 20th Biennial IEEE Conference on Electromagnetic Field Computation, CEFC 2022 ; Conference date: 24-10-2022 Through 26-10-2022",
year = "2022",
doi = "10.1109/CEFC55061.2022.9940818",
language = "English",
series = "CEFC 2022 - 20th Biennial IEEE Conference on Electromagnetic Field Computation, Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "CEFC 2022 - 20th Biennial IEEE Conference on Electromagnetic Field Computation, Proceedings",
address = "United States",
}