BESS life span evaluation in terms of battery wear through operation examples of BESS for frequency regulation

Jeonghyeon Choi, Hyeondeok Jo, Sekyung Han

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

6 Scopus citations

Abstract

Recently the application of frequency control using Battery Energy Storage System(BESS) has gained research interest due to the benefits of BESS. As such electric companies such as Korea Electric Power Corporation(KEPCO) has adopted this in their operation schemes. Most researches pertaining battery life assessment techniques do not take into account factors that cause deterioration. In this paper, we estimate battery life from the viewpoint of capacity through operational data of BESS for Frequency Regulation(FR). Also, the lifetime of the BESS is evaluated considering wear. The wear cost of each operation mode is derived by introducing a Wear Density Function reflecting factors of C-rate, temperature, and DOD.

Original languageEnglish
Title of host publication2017 IEEE Innovative Smart Grid Technologies - Asia
Subtitle of host publicationSmart Grid for Smart Community, ISGT-Asia 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-5
Number of pages5
ISBN (Electronic)9781538649503
DOIs
StatePublished - 8 Jun 2018
Event7th IEEE Innovative Smart Grid Technologies - Asia, ISGT-Asia 2017 - Auckland, New Zealand
Duration: 4 Dec 20177 Dec 2017

Publication series

Name2017 IEEE Innovative Smart Grid Technologies - Asia: Smart Grid for Smart Community, ISGT-Asia 2017

Conference

Conference7th IEEE Innovative Smart Grid Technologies - Asia, ISGT-Asia 2017
Country/TerritoryNew Zealand
CityAuckland
Period4/12/177/12/17

Keywords

  • Battery management system
  • Battery wear
  • Energy Storage system
  • Frequency regulation
  • State of health

Fingerprint

Dive into the research topics of 'BESS life span evaluation in terms of battery wear through operation examples of BESS for frequency regulation'. Together they form a unique fingerprint.

Cite this