TY - GEN
T1 - Bridging Fault Localisation and Defect Prediction
AU - Sohn, Jeongju
N1 - Publisher Copyright:
© 2020 ACM.
PY - 2020/10
Y1 - 2020/10
N2 - Identifying the source of a program failure plays an integral role in maintaining software quality. Both fault localisation and defect prediction aim to locate faults: Fault localisation aims to locate faults after they are revealed while defect prediction aims to locate yet-to-happen faults. Despite sharing a similar goal, fault localisation and defect prediction have been studied as separate topics, mainly due to the difference in available data to exploit. In our doctoral research, we aim to bridge fault localisation and defect prediction. Our work is divided into three parts: 1) applying defect prediction to fault localisation, i.e., DP2FL, 2) applying fault localisation to defect prediction, i.e., FL2DP, 3) consecutive application of DP2FL and FL2DP in a single framework. We expect the synergy between fault localisation and defect prediction not only to improve the accuracy of each process but to allow us to build a single model that gradually improve the overall software quality throughout the entire software development life-cycle.
AB - Identifying the source of a program failure plays an integral role in maintaining software quality. Both fault localisation and defect prediction aim to locate faults: Fault localisation aims to locate faults after they are revealed while defect prediction aims to locate yet-to-happen faults. Despite sharing a similar goal, fault localisation and defect prediction have been studied as separate topics, mainly due to the difference in available data to exploit. In our doctoral research, we aim to bridge fault localisation and defect prediction. Our work is divided into three parts: 1) applying defect prediction to fault localisation, i.e., DP2FL, 2) applying fault localisation to defect prediction, i.e., FL2DP, 3) consecutive application of DP2FL and FL2DP in a single framework. We expect the synergy between fault localisation and defect prediction not only to improve the accuracy of each process but to allow us to build a single model that gradually improve the overall software quality throughout the entire software development life-cycle.
KW - Defect Prediction
KW - Fault Localisation
KW - SBSE
UR - http://www.scopus.com/inward/record.url?scp=85098592193&partnerID=8YFLogxK
U2 - 10.1145/3377812.3381403
DO - 10.1145/3377812.3381403
M3 - Conference contribution
AN - SCOPUS:85094145039
T3 - Proceedings - 2020 ACM/IEEE 42nd International Conference on Software Engineering: Companion, ICSE-Companion 2020
SP - 214
EP - 217
BT - Proceedings - 2020 ACM/IEEE 42nd International Conference on Software Engineering
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 42nd ACM/IEEE International Conference on Software Engineering: Companion, ICSE-Companion 2020
Y2 - 27 June 2020 through 19 July 2020
ER -