Abstract
Thin films of oriented, polycrystalline p-type Zn0.9Mg 0.1O were deposited on n-type indium-tin oxide (ITO)-coated glass sub-strates by pulsed laser deposition at 400°C to form transparent wide bandgap heterojunctions. The characteristics of Au, Ni, or Pt contacts subsequently deposited on these heterojunction layers were examined. In each case, rectifying behavior of the p-n junction was obtained. The junctions display a negative temperature coefficient for reverse breakdown voltage. This approach looks promising as a means of realizing low-cost-substrate transparent electronics.
| Original language | English |
|---|---|
| Pages (from-to) | G145-G147 |
| Journal | Electrochemical and Solid-State Letters |
| Volume | 7 |
| Issue number | 7 |
| DOIs | |
| State | Published - 2004 |
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