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Characterization of thermal annealed n-ZnO/p-GaN/Al
2
O
3
Ju Young Lee
, Hong Seung Kim
, Hyung Koun Cho
, Young Yi Kim
, Bo Hyun Kong
,
Ho Seong Lee
Department of Materials Science and Metallurgical Engineering
Innovative Semiconductor Education and Research Center for Future Mobility
Korea Maritime and Ocean University
Sungkyunkwan University
Research output
:
Contribution to journal
›
Article
›
peer-review
9
Scopus citations
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2
O
3
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Material Science
Zinc Oxide
100%
Oxide Film
57%
Optical Property
28%
Structural Property
28%
Transmission Electron Microscopy
14%
Photoluminescence
14%
X-Ray Diffraction
14%
Atomic Force Microscopy
14%
Auger Electron Spectroscopy
14%
Engineering
Oxide Film
100%
Structural Property
50%
Transmissions
25%
Atomic Force Microscopy
25%
Ray Diffraction
25%
Ambient Air
25%
Mixed Phase
25%