Abstract
We have fabricated highly stable organic electroluminescent devices based on spin-coated poly-p-phenylene-vynylene (PPV) thin films. The electrical properties of aluminum cathode, prepared by ion beam assisted deposition, on PPV have been investigated and compared to those by thermal evaporation. Although energetic particles of Al assisted by Ar+ ion may damage the organic material, I- V-L characteristics are improved by applying thin Al buffer layer. In addition, a dense Al cathode inhibits the permeation of H2O and O2 into PPV film through pinhole defects, and thus retards dark spot growth. It may be deduced from highly packed structure of Al cathode with smaller junction resistance between Al and PPV. In conclusion, the lifetime of organic light-emitting device (OLED) has been extended effectively by dense Al film through ion beam assisted deposition process.
Original language | English |
---|---|
Pages (from-to) | 205-212 |
Number of pages | 8 |
Journal | Solid-State Electronics |
Volume | 49 |
Issue number | 2 |
DOIs | |
State | Published - Feb 2005 |
Keywords
- Ion beam assisted deposition
- Junction resistance
- Lifetime
- OLED