Chemically induced interface migration in PZT system during controlling of PbO content

In Chul Park; Seuk Chul Ko; Joon Hyung Lee; Jeong Joo Kim; Sang Hee Cho

doi:10.1080/10584580490459161

Chemically induced interface migration in PZT system during controlling of PbO content

In Chul Park, Seuk Chul Ko, Joon Hyung Lee, Jeong Joo Kim, Sang Hee Cho

Kyungpook National University

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

Chemically induced interface migration (CIIM) in Pb[(Co _1/3Nb_2/3)_0.1Zr_0.6Ti _0.3]O₃ (PCNZT) ceramics was investigated while controlling the PbO content. After sintering, stoichiometric samples were heat-treated in a PbO atmosphere allowing diffusion of PbO into grain boundaries (alloying), while the samples with excess PbO were heat-treated in air in order to promote PbO evaporation (dealloying). In both cases, an interface moving against their curvature was observed. Because of the zigzag structure of the grain boundaries, the mechanical properties improved.

Original language	English
Pages (from-to)	117-120
Number of pages	4
Journal	Integrated Ferroelectrics
Volume	63
DOIs	https://doi.org/10.1080/10584580490459161
State	Published - 2004

Keywords

Chemically induced interface migration
Mechanical property
Piezoelectric ceramics

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10.1080/10584580490459161

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title = "Chemically induced interface migration in PZT system during controlling of PbO content",

abstract = "Chemically induced interface migration (CIIM) in Pb[(Co 1/3Nb2/3)0.1Zr0.6Ti 0.3]O3 (PCNZT) ceramics was investigated while controlling the PbO content. After sintering, stoichiometric samples were heat-treated in a PbO atmosphere allowing diffusion of PbO into grain boundaries (alloying), while the samples with excess PbO were heat-treated in air in order to promote PbO evaporation (dealloying). In both cases, an interface moving against their curvature was observed. Because of the zigzag structure of the grain boundaries, the mechanical properties improved.",

keywords = "Chemically induced interface migration, Mechanical property, Piezoelectric ceramics",

author = "Park, {In Chul} and Ko, {Seuk Chul} and Lee, {Joon Hyung} and Kim, {Jeong Joo} and Cho, {Sang Hee}",

year = "2004",

doi = "10.1080/10584580490459161",

language = "English",

volume = "63",

pages = "117--120",

journal = "Integrated Ferroelectrics",

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T1 - Chemically induced interface migration in PZT system during controlling of PbO content

AU - Park, In Chul

AU - Ko, Seuk Chul

AU - Lee, Joon Hyung

AU - Kim, Jeong Joo

AU - Cho, Sang Hee

PY - 2004

Y1 - 2004

N2 - Chemically induced interface migration (CIIM) in Pb[(Co 1/3Nb2/3)0.1Zr0.6Ti 0.3]O3 (PCNZT) ceramics was investigated while controlling the PbO content. After sintering, stoichiometric samples were heat-treated in a PbO atmosphere allowing diffusion of PbO into grain boundaries (alloying), while the samples with excess PbO were heat-treated in air in order to promote PbO evaporation (dealloying). In both cases, an interface moving against their curvature was observed. Because of the zigzag structure of the grain boundaries, the mechanical properties improved.

AB - Chemically induced interface migration (CIIM) in Pb[(Co 1/3Nb2/3)0.1Zr0.6Ti 0.3]O3 (PCNZT) ceramics was investigated while controlling the PbO content. After sintering, stoichiometric samples were heat-treated in a PbO atmosphere allowing diffusion of PbO into grain boundaries (alloying), while the samples with excess PbO were heat-treated in air in order to promote PbO evaporation (dealloying). In both cases, an interface moving against their curvature was observed. Because of the zigzag structure of the grain boundaries, the mechanical properties improved.

KW - Chemically induced interface migration

KW - Mechanical property

KW - Piezoelectric ceramics

UR - http://www.scopus.com/inward/record.url?scp=33751169594&partnerID=8YFLogxK

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DO - 10.1080/10584580490459161

M3 - Article

AN - SCOPUS:33751169594

SN - 1058-4587

VL - 63

SP - 117

EP - 120

JO - Integrated Ferroelectrics

JF - Integrated Ferroelectrics

ER -

Chemically induced interface migration in PZT system during controlling of PbO content

Abstract

Keywords

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