TY - GEN
T1 - Chip-package co-modeling & verification of noise coupling & generation in CMOS DC/DC buck converter
AU - Song, Taigon
AU - Kim, Jiseong
AU - Pak, Junso
AU - Kim, Joungho
PY - 2009
Y1 - 2009
N2 - DC/DC Converters are now an essential part in a system due to the various needs of supply voltage that is necessary for different circuits in the system. However, there are many papers which have dealt for efficiency or for a novel structure that would be customized to the specific design, but few dealt with the noise characteristics of DC/DC Converters which could critically affect to the output supply voltage the target circuit would need. In this paper we analyzed the effect of noise to a DC/DC Converter in a chip-package co-design. We figured out that the decoupling capacitors on the PCB board cannot shield all the noise that could affect to the DC/DC converter, and on-chip decoupling capacitor for a DC/DC Converter would be necessary.
AB - DC/DC Converters are now an essential part in a system due to the various needs of supply voltage that is necessary for different circuits in the system. However, there are many papers which have dealt for efficiency or for a novel structure that would be customized to the specific design, but few dealt with the noise characteristics of DC/DC Converters which could critically affect to the output supply voltage the target circuit would need. In this paper we analyzed the effect of noise to a DC/DC Converter in a chip-package co-design. We figured out that the decoupling capacitors on the PCB board cannot shield all the noise that could affect to the DC/DC converter, and on-chip decoupling capacitor for a DC/DC Converter would be necessary.
UR - https://www.scopus.com/pages/publications/64249100105
U2 - 10.1109/EMCZUR.2009.4783446
DO - 10.1109/EMCZUR.2009.4783446
M3 - Conference contribution
AN - SCOPUS:64249100105
SN - 9783952328668
T3 - Proceedings of the 20th International Zurich Symposium on Electromagnetic Compatibility, EMC Zurich 2009
SP - 285
EP - 288
BT - Proceedings of the 20th International Zurich Symposium on Electromagnetic Compatibility, EMC Zurich 2009
T2 - 20th International Zurich Symposium on Electromagnetic Compatibility, EMC Zurich 2009
Y2 - 12 January 2009 through 16 January 2009
ER -