TY - JOUR
T1 - CMOS compatible low-power volatile atomic switch for steep-slope FET devices
AU - Lim, Seokjae
AU - Yoo, Jongmyung
AU - Song, Jeonghwan
AU - Woo, Jiyong
AU - Park, Jaehyuk
AU - Hwang, Hyunsang
N1 - Publisher Copyright:
© 2018 Author(s).
PY - 2018/7/16
Y1 - 2018/7/16
N2 - In this paper, we demonstrate a volatile atomic switch that can be utilized for obtaining steep subthreshold swing (SS) (<5 mV/dec) characteristics in FETs. We propose a CMOS-compatible atomic switch (W/Cu2S/W) that demonstrates volatility and immunity to the voltage-time dilemma. Furthermore, we enhance the device characteristics by examining the composition control, scaling of device size, and film thickness. Then, the atomic switch is integrated with a conventional transistor that has a large SS (>60 mV/dec). The result shows an improvement in the SS, which results from the transition of the atomic switch between the ON and OFF states, which is caused by the formation and rupture of a conductive filament. As a result, excellent switching characteristics are obtained for the FETs, such as low IOFF (∼10-5 μA/μm), high ION/IOFF ratio (∼105), low VDD (∼0.25 V), and steep SS (<5 mV/dec).
AB - In this paper, we demonstrate a volatile atomic switch that can be utilized for obtaining steep subthreshold swing (SS) (<5 mV/dec) characteristics in FETs. We propose a CMOS-compatible atomic switch (W/Cu2S/W) that demonstrates volatility and immunity to the voltage-time dilemma. Furthermore, we enhance the device characteristics by examining the composition control, scaling of device size, and film thickness. Then, the atomic switch is integrated with a conventional transistor that has a large SS (>60 mV/dec). The result shows an improvement in the SS, which results from the transition of the atomic switch between the ON and OFF states, which is caused by the formation and rupture of a conductive filament. As a result, excellent switching characteristics are obtained for the FETs, such as low IOFF (∼10-5 μA/μm), high ION/IOFF ratio (∼105), low VDD (∼0.25 V), and steep SS (<5 mV/dec).
UR - https://www.scopus.com/pages/publications/85050284208
U2 - 10.1063/1.5039898
DO - 10.1063/1.5039898
M3 - Article
AN - SCOPUS:85050284208
SN - 0003-6951
VL - 113
JO - Applied Physics Letters
JF - Applied Physics Letters
IS - 3
M1 - 033501
ER -