Comparative Study of Trans-linear and Trans-impedance Readout Circuits for Optical Beam Deflection Sensors in Atomic Force Microscopy

Bernard Ouma Alunda, Luke Oduor Otieno, Melody Chepkoech, Clare Chisu Byeon, Yong Joong Lee

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

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