Comparative Study of Trans-linear and Trans-impedance Readout Circuits for Optical Beam Deflection Sensors in Atomic Force Microscopy
- Bernard Ouma Alunda
- , Luke Oduor Otieno
- , Melody Chepkoech
- , Clare Chisu Byeon
- , Yong Joong Lee
- Kyungpook National University
Research output: Contribution to journal › Article › peer-review
1
Scopus
citations