Comparison between the capacitance and the signal-to-noise ratio of a PIN diode

Dong Ha Kah, Jae Beom Bae, Hyo Jung Hyun, Hwan Bae Park, Hyun Ok Kim

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

PIN diodes with areas of 1 × 1 cm2 were fabricated on 5-in., high-resistivity, <100>-orientation, and 380-μm-thick n-type silicon wafers. When a charged particle passes through the PIN diode and a reverse voltage is applied, electron-hole pairs are created and collected into the electrodes by the electric field. The capacitance and the signal-to-noise ratio of the PIN diode were measured as functions of the reverse bias voltage. The reciprocal of the capacitance has the same electrical behavior as the signal-to-noise ratio.

Original languageEnglish
Pages (from-to)27-29
Number of pages3
JournalJournal of the Korean Physical Society
Volume59
Issue number1
DOIs
StatePublished - Jul 2011

Keywords

  • CV measurement
  • PIN diode
  • Semiconductor detector
  • Signal-to-noise ratio

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