Abstract
PIN diodes with areas of 1 × 1 cm2 were fabricated on 5-in., high-resistivity, <100>-orientation, and 380-μm-thick n-type silicon wafers. When a charged particle passes through the PIN diode and a reverse voltage is applied, electron-hole pairs are created and collected into the electrodes by the electric field. The capacitance and the signal-to-noise ratio of the PIN diode were measured as functions of the reverse bias voltage. The reciprocal of the capacitance has the same electrical behavior as the signal-to-noise ratio.
Original language | English |
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Pages (from-to) | 27-29 |
Number of pages | 3 |
Journal | Journal of the Korean Physical Society |
Volume | 59 |
Issue number | 1 |
DOIs | |
State | Published - Jul 2011 |
Keywords
- CV measurement
- PIN diode
- Semiconductor detector
- Signal-to-noise ratio