Skip to main navigation Skip to search Skip to main content

Constant Voltage Stress (CVS) and Hot Carrier Injection (HCI) Degradations of Vertical Double-date InGaAs TFETs for Bio Sensor Applications

Research output: Contribution to journal › Article › peer-review

Fingerprint

Dive into the research topics of 'Constant Voltage Stress (CVS) and Hot Carrier Injection (HCI) Degradations of Vertical Double-date InGaAs TFETs for Bio Sensor Applications'. Together they form a unique fingerprint.
Sort by

Engineering