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Dependence of device performances on fin dimensions in AlGaN/GaN recessed-gate nanoscale FinFET
Gwan Min Yoo, Jae Hwa Seo, Young Jun Yoon, Young Jae Kim, Sung Yoon Kim, Hye Su Kang, Hye Rim Eun, Ra Hee Kwon, Young In Jang, In Man Kang, Seong Min Lee, Seongjae Cho
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
1
Scopus
citations