Design of centralized PID controllers for TITO processes

Byeong Eon Park, Su Whan Sung, In Beum Lee

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

A new method for designing the centralized proportional-integral-derivative (PID) controllers in two-input two-output (TITO) processes is proposed. The proposed method has two diagonal part PID controllers and two off-diagonal part PID controllers. The diagonal part PID controllers are to attenuate the interactions of the TITO processes and the off-diagonal part PID controllers are to track the setpoint. The diagonal part PID controllers are directly tuned by the conventional single-input single-output (SISO) PID tuning methods on the basis of the diagonal part of a process model matrix. And the tuning parameters of the off-diagonal part PID controllers are calculated by minimizing the effects of the off-diagonal components of the open-loop transfer function matrix in frequency domain. The proposed control method shows better decoupling and setpoint tracking performance than previous approaches.

Original languageEnglish
Title of host publication2017 6th International Symposium on Advanced Control of Industrial Processes, AdCONIP 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages523-528
Number of pages6
ISBN (Electronic)9781509043972
DOIs
StatePublished - 18 Jul 2017
Event6th International Symposium on Advanced Control of Industrial Processes, AdCONIP 2017 - Taipei, Taiwan, Province of China
Duration: 28 May 201731 May 2017

Publication series

Name2017 6th International Symposium on Advanced Control of Industrial Processes, AdCONIP 2017

Conference

Conference6th International Symposium on Advanced Control of Industrial Processes, AdCONIP 2017
Country/TerritoryTaiwan, Province of China
CityTaipei
Period28/05/1731/05/17

Fingerprint

Dive into the research topics of 'Design of centralized PID controllers for TITO processes'. Together they form a unique fingerprint.

Cite this