TY - GEN
T1 - Development of the silicon photo-strip sensor
AU - Kah, D. H.
AU - Bae, J. B.
AU - Hyun, H. J.
AU - Kim, H. J.
AU - Kim, H. O.
AU - Park, H.
PY - 2009
Y1 - 2009
N2 - We have designed and fabricated silicon photo-strip sensors with polysilicon resistors and coupling capacitors. This developed detector consists of two photo-strip sensors sandwiching opposite faces of a crystal scintillator and being oriented orthogonal to each other. This configuration is able to provides the 2 dimensional position information and to measure the energy. Therefore they can be used in nuclear and medical application. The developed sensor has p+ strip array for signal readout. On the other hand, the rear side is a light entrance window which has very thin n+ doping layer with anti-reflective coating to prevent light losing. These sensors are fabricated on a 5-in., 380 μ-thickness, n-type, high resistivity silicon wafer. The leakage currents of the fabricated sensors are measured as a function of the reverse bias voltages. The light responses of fabricated silicon photosensors coupled with a CsI(Tl) crystal are measured by using 241Am, 22Na and 137Cs radioactive sources. The energy resolutions of the photodiode coupled with the crystal are obtained to be 20.5 % and 13.8 % for the 22Na (511 keV) and the 137Cs (662 keV) γ-rays. The one-dimensional position information by the α particles (241Am) are clearly observed by the photo-strip sensor coupled with the crystal.
AB - We have designed and fabricated silicon photo-strip sensors with polysilicon resistors and coupling capacitors. This developed detector consists of two photo-strip sensors sandwiching opposite faces of a crystal scintillator and being oriented orthogonal to each other. This configuration is able to provides the 2 dimensional position information and to measure the energy. Therefore they can be used in nuclear and medical application. The developed sensor has p+ strip array for signal readout. On the other hand, the rear side is a light entrance window which has very thin n+ doping layer with anti-reflective coating to prevent light losing. These sensors are fabricated on a 5-in., 380 μ-thickness, n-type, high resistivity silicon wafer. The leakage currents of the fabricated sensors are measured as a function of the reverse bias voltages. The light responses of fabricated silicon photosensors coupled with a CsI(Tl) crystal are measured by using 241Am, 22Na and 137Cs radioactive sources. The energy resolutions of the photodiode coupled with the crystal are obtained to be 20.5 % and 13.8 % for the 22Na (511 keV) and the 137Cs (662 keV) γ-rays. The one-dimensional position information by the α particles (241Am) are clearly observed by the photo-strip sensor coupled with the crystal.
UR - http://www.scopus.com/inward/record.url?scp=77951182251&partnerID=8YFLogxK
U2 - 10.1109/NSSMIC.2009.5402228
DO - 10.1109/NSSMIC.2009.5402228
M3 - Conference contribution
AN - SCOPUS:77951182251
SN - 9781424439621
T3 - IEEE Nuclear Science Symposium Conference Record
SP - 1730
EP - 1733
BT - 2009 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2009
T2 - 2009 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2009
Y2 - 25 October 2009 through 31 October 2009
ER -