TY - GEN
T1 - Development of Visual Inspection System for Assembly Machine
AU - Kim, Jeonghong
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/8/14
Y1 - 2018/8/14
N2 - In a factory that assembles various devices, functional inspection and visual inspection are carried out before the product is shipped out. Most functional tests are done automatically through the system, whereas visual inspection is done by the human eyes. Human remember what they have just seen before, and it is difficult to detect the failure of a similar assembly device. Even if the function of the assembling device is satisfied, there is a problem in the reliability of the quality control due to the appearance error. Various image processing techniques have been developed to solve this problem. In this paper, we proposed a method to improve the accuracy of error detection by applying the CNN model to the external inspection of the assembling device.
AB - In a factory that assembles various devices, functional inspection and visual inspection are carried out before the product is shipped out. Most functional tests are done automatically through the system, whereas visual inspection is done by the human eyes. Human remember what they have just seen before, and it is difficult to detect the failure of a similar assembly device. Even if the function of the assembling device is satisfied, there is a problem in the reliability of the quality control due to the appearance error. Various image processing techniques have been developed to solve this problem. In this paper, we proposed a method to improve the accuracy of error detection by applying the CNN model to the external inspection of the assembling device.
KW - Convolution Neural Network
KW - Image classification
KW - Image processing
KW - Machine Learning
UR - http://www.scopus.com/inward/record.url?scp=85052528510&partnerID=8YFLogxK
U2 - 10.1109/ICUFN.2018.8436961
DO - 10.1109/ICUFN.2018.8436961
M3 - Conference contribution
AN - SCOPUS:85052528510
SN - 9781538646465
T3 - International Conference on Ubiquitous and Future Networks, ICUFN
SP - 859
EP - 861
BT - ICUFN 2018 - 10th International Conference on Ubiquitous and Future Networks
PB - IEEE Computer Society
T2 - 10th International Conference on Ubiquitous and Future Networks, ICUFN 2018
Y2 - 3 July 2018 through 6 July 2018
ER -