Distinguished student paper: Driving waveform with multi-scan high level for stable address discharge under variable ambient temperature

To explain the address discharge fail at a high temperature, the wall charge leakage phenomenon during address-period is investigated relative to the number of applied address and sustain pulses under variable ambient temperature based on the V_t closed-curve analysis. The wall charge leakages are increased with an increase in the number of the applied address and sustain pulse, and this tendency are intensified as the ambient temperature increased. It is also observed that the wall charge leakage during address period depends on the level of scan high voltage. Base on the experimental observation, the driving waveform with multi scan high level is proposed to produce the stable address discharge under variable ambient temperature.