Abstract
The experimental observation on the IR emission during a ramp-up reset period shows that the activated MgO surface and the wall charges accumulating on the address electrode prior to the reset period are two dominant factors for a temporal dark image sticking phenomenon. The new driving waveforms, including pre-reset and reset waveforms, and negative-going ramp-type X bias, are proposed for a complete elimination of the temporal dark image sticking without deteriorating the address discharge characteristics. As a result of monitoring the difference in the IR emission and luminance between the cells with and without image sticking, it is observed that the proposed driving waveform can remove the temporal dark image sticking completely without deteriorating the address discharge characteristics.
Original language | English |
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Pages | 1465-1468 |
Number of pages | 4 |
State | Published - 2005 |
Event | IDW/AD'05 - 12th International Display Workshops in Conjunction with Asia Display 2005 - Takamatsu, Japan Duration: 6 Dec 2005 → 9 Dec 2005 |
Conference
Conference | IDW/AD'05 - 12th International Display Workshops in Conjunction with Asia Display 2005 |
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Country/Territory | Japan |
City | Takamatsu |
Period | 6/12/05 → 9/12/05 |