Dynamic MAC Unit Pruning Techniques in Runtime RTL Simulation for Area-Accuracy Efficient Implementation of Neural Network Accelerator

Jisu Kwon, Heuijee Yun, Daejin Park

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Designing lightweight hardware accelerators that maintain model inference accuracy is a challenging task in edge artificial intelligence (AI) because of the heterogeneous design requirements between the software model and hardware accelerator. While model pruning is an effective approach for reducing the number of parameters and computational requirements, conventional software model pruning leads to inefficient overhead when deploying the model in a general-purpose accelerator for inference. To overcome these challenges, we propose an empirical register transfer level (RTL) simulation-based accelerator pruning technique that is optimized for domain applications and models. Specifically, the proposed technique measures the dynamic switching of processing element (PE) unit-wise signals during dataset sample inference on a 2D array of PEs and replaces it with dummy PEs based on the RTL simulation results. The proposed approach reduces the accelerator's area and power resource consumption while maintaining baseline accuracy. We automated the RTL generation and simulation reconfiguration process to enable PE pruning that requires iterative and empirical RTL simulation based on signal switching count results. Our experimental results show that while the model's inference accuracy decreased by only 1% (98% to 97%), we were able to reduce dynamic signal switching and synthesized area by up to 9.78% and 4.25%, respectively. Our approach suggests a lightweight hardware accelerator design that is dedicated to the target application and can be scaled without modifying the model.

Original languageEnglish
Title of host publication2023 IEEE 66th International Midwest Symposium on Circuits and Systems, MWSCAS 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages207-211
Number of pages5
ISBN (Electronic)9798350302103
DOIs
StatePublished - 2023
Event2023 IEEE 66th International Midwest Symposium on Circuits and Systems, MWSCAS 2023 - Tempe, United States
Duration: 6 Aug 20239 Aug 2023

Publication series

NameMidwest Symposium on Circuits and Systems
ISSN (Print)1548-3746

Conference

Conference2023 IEEE 66th International Midwest Symposium on Circuits and Systems, MWSCAS 2023
Country/TerritoryUnited States
CityTempe
Period6/08/239/08/23

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