Effect of microwave irradiation on the electrical and optical properties of SnO                         2                          thin films

Jae Hoon Bang; Namgue Lee; Ali Mirzaei; Myung Sik Choi; Han Gil Na; Changhyun Jin; Wansik Oum; Seokyoon Shin; Hyeong Su Choi; Hyunwoo Park; Yeonsik Choi; Hyeongtag Jeon; Hyoun Woo Kim

doi:10.1016/j.ceramint.2019.01.074

Effect of microwave irradiation on the electrical and optical properties of SnO ₂ thin films

Jae Hoon Bang, Namgue Lee, Ali Mirzaei, Myung Sik Choi, Han Gil Na, Changhyun Jin, Wansik Oum, Seokyoon Shin, Hyeong Su Choi, Hyunwoo Park, Yeonsik Choi, Hyeongtag Jeon, Hyoun Woo Kim

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30 Scopus citations

Abstract

We report the electrical and optical characteristics of SnO ₂ thin films irradiated by microwaves (MWs) and grown using atomic layer deposition in a commercial MW oven operating at a frequency of 2.45 GHz. The properties of the MW-irradiated SnO ₂ thin films were compared with those of the as-deposited SnO ₂ thin films. After MW irradiation, the conductivity and transparency of the thin films were enhanced. In addition, the samples irradiated for 5 min showed optimal carrier concentration, Hall mobility, resistivity, and transmittance values of 1.5 × 10 ²⁰ cm ⁻³ , 4.6 cm ² /V s, 8 × 10 ⁻³ Ω cm, and 95.77%, respectively. The improved properties of the MW-irradiated samples were attributed mainly to the formation of an oxygen vacancy in the SnO ₂ lattice during MW irradiation. Our results can be applied for the fabrication of pure SnO ₂ -based transparent conductive oxides; these oxides are generally doped with other elements.

Original language	English
Pages (from-to)	7723-7729
Number of pages	7
Journal	Ceramics International
Volume	45
Issue number	6
DOIs	https://doi.org/10.1016/j.ceramint.2019.01.074
State	Published - 15 Apr 2019

Keywords

Electrical and optical properties
Microwave irradiation
SnO
Transparent conductive oxide

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10.1016/j.ceramint.2019.01.074

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Bang, J. H., Lee, N., Mirzaei, A., Choi, M. S., Na, H. G., Jin, C., Oum, W., Shin, S., Choi, H. S., Park, H., Choi, Y., Jeon, H., & Kim, H. W. (2019). Effect of microwave irradiation on the electrical and optical properties of SnO ₂ thin films Ceramics International, 45(6), 7723-7729. https://doi.org/10.1016/j.ceramint.2019.01.074

@article{06d5ba03f6124615a4f1092530329c9e,

title = " Effect of microwave irradiation on the electrical and optical properties of SnO 2 thin films ",

abstract = " We report the electrical and optical characteristics of SnO 2 thin films irradiated by microwaves (MWs) and grown using atomic layer deposition in a commercial MW oven operating at a frequency of 2.45 GHz. The properties of the MW-irradiated SnO 2 thin films were compared with those of the as-deposited SnO 2 thin films. After MW irradiation, the conductivity and transparency of the thin films were enhanced. In addition, the samples irradiated for 5 min showed optimal carrier concentration, Hall mobility, resistivity, and transmittance values of 1.5 × 10 20 cm −3 , 4.6 cm 2 /V s, 8 × 10 −3 Ω cm, and 95.77%, respectively. The improved properties of the MW-irradiated samples were attributed mainly to the formation of an oxygen vacancy in the SnO 2 lattice during MW irradiation. Our results can be applied for the fabrication of pure SnO 2 -based transparent conductive oxides; these oxides are generally doped with other elements.",

keywords = "Electrical and optical properties, Microwave irradiation, SnO, Transparent conductive oxide",

author = "Bang, {Jae Hoon} and Namgue Lee and Ali Mirzaei and Choi, {Myung Sik} and Na, {Han Gil} and Changhyun Jin and Wansik Oum and Seokyoon Shin and Choi, {Hyeong Su} and Hyunwoo Park and Yeonsik Choi and Hyeongtag Jeon and Kim, {Hyoun Woo}",

note = "Publisher Copyright: {\textcopyright} 2019 Elsevier Ltd and Techna Group S.r.l.",

year = "2019",

month = apr,

day = "15",

doi = "10.1016/j.ceramint.2019.01.074",

language = "English",

volume = "45",

pages = "7723--7729",

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Bang, JH, Lee, N, Mirzaei, A, Choi, MS, Na, HG, Jin, C, Oum, W, Shin, S, Choi, HS, Park, H, Choi, Y, Jeon, H & Kim, HW 2019, ' Effect of microwave irradiation on the electrical and optical properties of SnO ₂ thin films ', Ceramics International, vol. 45, no. 6, pp. 7723-7729. https://doi.org/10.1016/j.ceramint.2019.01.074

Effect of microwave irradiation on the electrical and optical properties of SnO ₂ thin films . / Bang, Jae Hoon; Lee, Namgue; Mirzaei, Ali et al.
In: Ceramics International, Vol. 45, No. 6, 15.04.2019, p. 7723-7729.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Effect of microwave irradiation on the electrical and optical properties of SnO 2 thin films

AU - Bang, Jae Hoon

AU - Lee, Namgue

AU - Mirzaei, Ali

AU - Choi, Myung Sik

AU - Na, Han Gil

AU - Jin, Changhyun

AU - Oum, Wansik

AU - Shin, Seokyoon

AU - Choi, Hyeong Su

AU - Park, Hyunwoo

AU - Choi, Yeonsik

AU - Jeon, Hyeongtag

AU - Kim, Hyoun Woo

PY - 2019/4/15

Y1 - 2019/4/15

N2 - We report the electrical and optical characteristics of SnO 2 thin films irradiated by microwaves (MWs) and grown using atomic layer deposition in a commercial MW oven operating at a frequency of 2.45 GHz. The properties of the MW-irradiated SnO 2 thin films were compared with those of the as-deposited SnO 2 thin films. After MW irradiation, the conductivity and transparency of the thin films were enhanced. In addition, the samples irradiated for 5 min showed optimal carrier concentration, Hall mobility, resistivity, and transmittance values of 1.5 × 10 20 cm −3 , 4.6 cm 2 /V s, 8 × 10 −3 Ω cm, and 95.77%, respectively. The improved properties of the MW-irradiated samples were attributed mainly to the formation of an oxygen vacancy in the SnO 2 lattice during MW irradiation. Our results can be applied for the fabrication of pure SnO 2 -based transparent conductive oxides; these oxides are generally doped with other elements.

AB - We report the electrical and optical characteristics of SnO 2 thin films irradiated by microwaves (MWs) and grown using atomic layer deposition in a commercial MW oven operating at a frequency of 2.45 GHz. The properties of the MW-irradiated SnO 2 thin films were compared with those of the as-deposited SnO 2 thin films. After MW irradiation, the conductivity and transparency of the thin films were enhanced. In addition, the samples irradiated for 5 min showed optimal carrier concentration, Hall mobility, resistivity, and transmittance values of 1.5 × 10 20 cm −3 , 4.6 cm 2 /V s, 8 × 10 −3 Ω cm, and 95.77%, respectively. The improved properties of the MW-irradiated samples were attributed mainly to the formation of an oxygen vacancy in the SnO 2 lattice during MW irradiation. Our results can be applied for the fabrication of pure SnO 2 -based transparent conductive oxides; these oxides are generally doped with other elements.

KW - Electrical and optical properties

KW - Microwave irradiation

KW - SnO

KW - Transparent conductive oxide

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SN - 0272-8842

VL - 45

SP - 7723

EP - 7729

JO - Ceramics International

JF - Ceramics International

IS - 6

ER -

Effect of microwave irradiation on the electrical and optical properties of SnO ₂ thin films

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