Effect of oxygen plasma treatment on p-type electrical properties of amorphous La2NiO4+δ thin films

Dang Hoang Hop, Young Woo Heo, Jeong Joo Kim, Soo Young Park, Inn Kyu Kang, Youngkyoo Kim, Joon Hyung Lee

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

La2NiO2NiO4+δ shows a p-type electrical conductivity, due to the incorporation of oxygen ions (δ) in its lattice. In the present study, amorphous La2NiO2NiO4+δ thin films were fabricated by radio frequency (RF) magnetron sputtering. To investigate the effect of oxygen plasma treatment on the electrical properties of La2NiO2NiO4+δ thin films, the films were exposed to oxygen plasma for varying times. The as-deposited films at room temperature exhibit an increase in carrier concentration from 6.20× 1013 cm-3 to 4.61×1014 cm-3 after a 60-minute exposure to oxygen plasma. On the basis of the XPS spectra analysis, the binding energies of oxygen and nickel ions were found to be shifted towards higher energies, indicating an increase in the oxidation states of the cations.

Original languageEnglish
Pages (from-to)475-479
Number of pages5
JournalJournal of Nanoelectronics and Optoelectronics
Volume10
Issue number4
DOIs
StatePublished - 1 Aug 2015

Keywords

  • LaNiO
  • Oxygen plasma
  • P-type
  • Thin films

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