Effect of oxygen species on the positive flat-band voltage shift in Al 2O3/GaN metal-insulator-semiconductor capacitors with post-deposition annealing
- Hee Sung Kang
- , M. Siva Pratap Reddy
- , Dong Seok Kim
- , Ki Won Kim
- , Jong Bong Ha
- , Yong Soo Lee
- , Hyun Chul Choi
- , Jung Hee Lee
- Kyungpook National University
- Samsung
Research output: Contribution to journal › Article › peer-review
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